Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T10:32:13.145Z Has data issue: false hasContentIssue false
  • English
  • Français

Exploring Helium Mitigation in Ferritic Alloys by Advanced Microscopy

Published online by Cambridge University Press:  23 September 2015

Chad M. Parish ,
Philip D. Edmondson ,
Fred W. Meyer ,
Mark E. Bannister ,
Baishakhi Mazumder  and
Michael K. Miller
Chad M. Parish
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Philip D. Edmondson
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Fred W. Meyer
Affiliation:
Physics Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Mark E. Bannister
Affiliation:
Physics Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Baishakhi Mazumder
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA
Michael K. Miller
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 753 - 754
Copyright
Copyright © Microscopy Society of America 2015 

References

Reference:

[1] Zinkle, SJ & Ghoniem, NM, Fus. Eng. Des V51 (2000). P. 55.CrossRefGoogle Scholar
[2] Klueh, RL, et al., Curr. Op. Sol. State Mater. Sci V8 (2004). P. 239.Google Scholar
[3] Edmondson, PD, et al., J. Nucl. Mater. V434 (2013). P. 210.CrossRefGoogle Scholar
[4] Mazumder, B, et al., Nucl. Mater. and Energy 1 (2015). in press.Google Scholar
[5] Yao, B., et al., J. Electron Micros V61 (2012). P. 393.Google Scholar
[6] Parish, CM & Miller, MK, Microsc. Microan V20 (2014). P. 568.Google Scholar
[7] Schlossmacher, P, et al., Micros. Today (July 2010). P. 14.Google Scholar
[8] This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. A portion of the Microscopy was conducted as part of a user proposal at ORNL's Center for Nanophase Materials Sciences, which is an Office of Science User Facility. We acknowledge the use of the Analytical Instrumentation Facility (AIF) at NCarolina State University, which is supported by the State of North Carolina and the National Science Foundation. We thank Dr. D. T. Hoelzer for 14YWT sample material..Google Scholar