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Exploiting the in-situ Electrical X-ray Microscopy for Semiconductor Nano Devices Analysis by X-ray Nanoprobe Beamline at Taiwan Photon Source
Published online by Cambridge University Press: 10 August 2018
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- Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 430 - 431
- Copyright
- © Microscopy Society of America 2018
References
[1] Lin, Bi-Hsuan, Chen, Huang-Yeh, Tseng, Shao-Chin, Wu, Jian-Xing, Chen, Bo-Yi, Lee, Chien-Yu, Yin, Gung-Chian, Chang, Shih-Hung, Tang, Mau-Tsu
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Chang, Shih-Hung
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[4] Ministry of Science and Technology of Taiwan (105-2112-M-213-011-MY2) and the National Synchrotron Radiation Research Center provided support for this research..Google Scholar
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