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Experiments on Foucault Imaging of Superconducting Fluxons

Published online by Cambridge University Press:  02 July 2020

T. Yoshida ,
J. Endo ,
K. Harada ,
H. Kasai ,
T. Matsuda ,
M. Beleggia ,
G. Pozzi  and
A. Tonomura
T. Yoshida
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama,Saitama350-03, Japan.
J. Endo
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama,Saitama350-03, Japan.
K. Harada
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama,Saitama350-03, Japan.
H. Kasai
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama,Saitama350-03, Japan.
T. Matsuda
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama,Saitama350-03, Japan.
M. Beleggia
Affiliation:
Department of Physics and Istituto Nazionale di Fisica per la Materia,viale B. Pichat 6/2, 40127, Bologna, Italy.
G. Pozzi
Affiliation:
Department of Physics and Istituto Nazionale di Fisica per la Materia,viale B. Pichat 6/2, 40127, Bologna, Italy.
A. Tonomura
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama,Saitama350-03, Japan.
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Extract

The out-of-focus method has been successfully employed in the dynamical observation of superconducting fluxons. However, owing to the large defocus distance needed to image fluxons with enough contrast it turns out that their correlation with structural defects, better imaged at focus, is troublesome. Among the standard methods of Lorentz microscopy the Foucault technique is a good candidate for removing this drawback, since it generates phase contrast in the focused image by masking part of the transmitted beam by means of an aperture.

Therefore, simulations have been carried out both for one-dimensional fluxon models and more realistic two dimensional ones, with the result that enough contrast can be generated in the focused image in order to detect them. However, although these theoretical results suggest the feasibility of Foucault experiments, filling the gap between theory and practice is not an easy task, especially when considering the small angular deflections involved, of the order of 10−5 rad.

Type
Recent Developments in Microscopy for Studying Electronic and Magnetic Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 507 - 508
Copyright
Copyright © Microscopy Society of America 1997

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References

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