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Experimental Validation for Infrared Microspectroscopy (IMS)

Published online by Cambridge University Press:  02 July 2020

John A. Reffner ,
Robert W. Hornlein  and
John W. Hellgeth
John A. Reffner
Affiliation:
Spectra-Tech Inc.Shelton, CT. 06484
Robert W. Hornlein
Affiliation:
Spectra-Tech Inc.Shelton, CT. 06484
John W. Hellgeth
Affiliation:
Spectra-Tech Inc.Shelton, CT. 06484
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Extract

In today’s laboratory environment, it is important that the performance of analytical instruments be tested and validated. In the past, the testing of infrared micro- spectrometers was based solely upon measuring a signal-to-noise (SNR) ratio of the 100% line. This test is insufficient. It is important to test how well the sample area is defined. In all current commercial infrared spectrometer systems, remote image plane masks are used to define specific areas for infrared spectral analysis. A special test specimen has been developed to evaluate the accuracy of the mask’s ability to define the sample area.

IMS resolution test plates were constructed by photolithographic reproduction of a series geometrically shaped thin polymer films on both infrared transparent windows and gold mirrors. First the surface of the plate is coated with a thin, uniform layer of a photoresist polymer. Then this surface is printed with geometrical patterns such as bands, discs and squares.

Type
Optical Microanalysis
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 867 - 868
Copyright
Copyright © Microscopy Society of America 1997

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