Experience with the IBM Sub-Angstrom STEM

P. E. Batson

doi:10.1017/S1431927603441196

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Experience with the IBM Sub-Angstrom STEM

Published online by Cambridge University Press: 15 July 2003

P. E. Batson

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P. E. Batson*: Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, New York 10598

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Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 136 - 137

DOI: https://doi.org/10.1017/S1431927603441196 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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Experience with the IBM Sub-Angstrom STEM

Volume 9, Issue S02
P. E. Batson ^(a1)
DOI: https://doi.org/10.1017/S1431927603441196

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Experience with the IBM Sub-Angstrom STEM

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