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Exit Wave Function Retrieval from Diffraction Patterns with Variable SAED Aperture

Published online by Cambridge University Press:  31 July 2006

V Volkov ,
J Wall  and
Y Zhu
V Volkov
Affiliation:
Brookhaven National Laboratory
J Wall
Affiliation:
Brookhaven National Laboratory
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1670 - 1671
Copyright
© 2006 Microscopy Society of America