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Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries

Published online by Cambridge University Press:  23 September 2015

Michael Presley ,
Dan Huber  and
Hamish Fraser
Michael Presley
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Dan Huber
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1411 - 1412
Copyright
Copyright © Microscopy Society of America 2015 

References

Reference:

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[4] Kato, N., Journal of Electron Microscopy 53 (2004) 451–458.Google Scholar