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Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition

Published online by Cambridge University Press:  04 August 2017

Ty J. Prosa ,
David A. Reinhard ,
H.G. Francois-Saint-Cyr ,
Isabelle Martin ,
Katherine P. Rice ,
Yimeng Chen  and
David J. Larson
Ty J. Prosa
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
David A. Reinhard
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
H.G. Francois-Saint-Cyr
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Isabelle Martin
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Katherine P. Rice
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Yimeng Chen
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
David J. Larson
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 616 - 617
Copyright
© Microscopy Society of America 2017 

References

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[2] Larson, D.J., et al, Local Electrode Atom Probe Tomography. Springer New York 2013.CrossRefGoogle Scholar
[3] Kingham, D.R. Surf. Sci. 116 1981). p. 273.CrossRefGoogle Scholar
[4] Schreiber, D.K., et al., Appl. Phys. Lett. 105 2014). p. 244106.CrossRefGoogle Scholar