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Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe / Si (110) Using STEM Moiré Observation and its Image Analysis

Published online by Cambridge University Press:  05 August 2019

Junji Yamanaka*
Affiliation:
Center for Instrumental Analysis, University of Yamanashi, 4-3-11 Takeda, Kofu, JAPAN
Chiaya Yamamoto
Affiliation:
Center for Instrumental Analysis, University of Yamanashi, 4-3-11 Takeda, Kofu, JAPAN
Mai Shirakura
Affiliation:
Center for Instrumental Analysis, University of Yamanashi, 4-3-11 Takeda, Kofu, JAPAN
Kosuke O. Hara
Affiliation:
Center for Cryst. Sci. & Tech., University of Yamanashi, Miyamaecho, Kofu, JAPAN
Keisuke Arimoto
Affiliation:
Center for Cryst. Sci. & Tech., University of Yamanashi, Miyamaecho, Kofu, JAPAN
Kiyokazu Nakagawa
Affiliation:
Center for Cryst. Sci. & Tech., University of Yamanashi, Miyamaecho, Kofu, JAPAN
Akimitsu Ishizuka
Affiliation:
HREM Research Inc., 14-48 Matsukazedai, Higashimastuyama, JAPAN
Kazuo Ishizuka
Affiliation:
HREM Research Inc., 14-48 Matsukazedai, Higashimastuyama, JAPAN
*
*Corresponding author: [email protected]

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

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[4]Ishizuka, Akimitsu, Hytch, Martin and Kazuo Ishizuka, , Microscopy, 66 (2017), p. 217.Google Scholar
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[6]Yamanaka, Junji et al. , J. Mat. Sci. & Chem. Eng., 6 (2018), p. 8.Google Scholar