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Evaluating Compositional Variation in InGaAs Random Alloys Using Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2018

Nicole A. Kotulak
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Mark E. Twigg
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Nadeemullah A. Mahadik
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Stephanie Tomasulo
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
P. L. Bonanno
Affiliation:
ASEE Postdoctoral Associate residing at the U.S. Naval Research Laboratory
N. R. Pereira
Affiliation:
Ecopulse, Inc., Springfield, VA, USA
Keith Knipling
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Michael K. Yakes
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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[9] The authors acknowledge funding support from the Office of Naval Research. P. L. B. held an ASEE Postdoctoral Fellowship at the time this work was performed.Google Scholar