Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-09T15:18:31.198Z Has data issue: false hasContentIssue false
  • English
  • Français

Etching and High-Resolution Backscatter Electron Imaging for Semi-Automated Segmentation and Stereology of the Gamma Prime Phase in Ni-based Superalloys

Published online by Cambridge University Press:  01 August 2010

EJ Payton ,
PJ Phillips  and
MJ Mills
EJ Payton
Affiliation:
Ruhr-Universität Bochum, Germany
PJ Phillips
Affiliation:
The Ohio State University
MJ Mills
Affiliation:
The Ohio State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 682 - 683
Copyright
Copyright © Microscopy Society of America 2010