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Errors, Artifacts, and Improvements in EBSD Processing and Mapping

Published online by Cambridge University Press:  28 January 2005

Xiaodong Tao  and
Alwyn Eades
Xiaodong Tao
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015-3198, USA
Alwyn Eades
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015-3198, USA
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Abstract

Electron back scatter diffraction (EBSD) mapping and indexing has rapidly come into widespread use. However, inadequate attention has been paid to the details of the method. Many of the algorithms in current use were chosen because they were the first ones that were found to work, rather than because they were optimum. Results of systematic study are presented. It is shown that more than one method can successfully correct a sampling artifact, that there is an optimum binning ratio, that Gaussian filtering provides an alternative to “butterfly convolution,” that better alternatives for mapping image quality than those in current use are available, and that saving all the original patterns is practical and advantageous.

Keywords

electron back scatter diffractionEBSDHough transformartifactsGaussian filterbinningIQimage quality
Type
INSTRUMENTATION AND TECHNIQUES
Information
Microscopy and Microanalysis , Volume 11 , Issue 1 , February 2005 , pp. 79 - 87
Copyright
© 2005 Microscopy Society of America

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References

REFERENCES

Krämer, S. & Mayer, J. (1999). Using the Hough transform for HOLZ line identification in convergent beam electron diffraction. J Microsc 194, 2–11.Google Scholar
Krieger Lassen, N.C., Jensen, D.J., & Conradson, K. (1992). Image processing procedures for analysis of electron back scattering patterns. Scan Microsc 6, 115–121.Google Scholar
Schwartz, A.J., Kumar, M., & Adams, B.L. (2000). Electron Backscatter Diffraction in Materials Science. New York: Kluwer Academic.
Sonka, M., Hlavac, V., & Boyle, R. (1998). Image Processing, Analysis, and Machine Vision. 2nd ed. Boston: PWS Publishing.
Tao, X. & Eades, J.A. (2001). A routine to determine the shift of Kikuchi bands in EBSP to sub-pixel resolution. Microsc Microanal 7(Suppl. 2), 366.Google Scholar
Tao, X. & Eades, J.A. (2002). Alternatives to image quality mapping in EBSD, microscopy and microanalysis. Microsc Microanal 8(Suppl. 2), 692CD.Google Scholar
Thermo Noran Company. (1999). Phase ID (User Manual).
Toft, P. (1996). The Radon Transform: Theory and Implementation. PhD Thesis, Technical University of Denmark, Lyngby. Available at: http://www.adm.dtu.dk/fakta/darwin/index_e.htm
Young, I.T. & van Vliet, L.I. (1995). Recursive implementation of the Gaussian filter. Signal Process 44, 139–151.Google Scholar