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Epoxy Resin Removal Technique in Cross-section Cuts for SEM

Published online by Cambridge University Press:  30 July 2020

Guillermina Gonzalez-Mancera
Guillermina Gonzalez-Mancera*
Affiliation:
National Autonomous University of Mexico (UNAM), Mexico, Distrito Federal, Mexico

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2690 - 2691
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Copyright
Copyright © Microscopy Society of America 2020

References

Richard, Wirth, Focused Ion Beam (FIB) combined with SEM and TEM: Advanced Analytical Tools for Studies of Chemical Composition, Microstructure and Crystal structure in Geomaterials on a Nanometre scale. Chemical Geology, Elsevier. 2019, (261) 217–229.10.1016/j.chemgeo.2008.05.019CrossRefGoogle Scholar