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Epitaxial Growth of ZnO Monolayer on Graphene: The Thinnest Metal Oxide Semiconductor

Published online by Cambridge University Press:  04 August 2017

Hyo-Ki Hong ,
Jongyeong Lee ,
Na Yeon Kim ,
Seoungwoo Son ,
Jung Hwa Kim ,
Rolf Erni  and
Zonghoon Lee
Hyo-Ki Hong
Affiliation:
School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, S. Korea
Jongyeong Lee
Affiliation:
School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, S. Korea
Na Yeon Kim
Affiliation:
School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, S. Korea Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan 44919, S. Korea
Seoungwoo Son
Affiliation:
School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, S. Korea
Jung Hwa Kim
Affiliation:
School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, S. Korea
Rolf Erni
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Diibendorf, Switzerland
Zonghoon Lee
Affiliation:
School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, S. Korea Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan 44919, S. Korea

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1434 - 1435
Copyright
© Microscopy Society of America 2017 

References

[1] Chung, K., et al, Science 330 2010). p. 655–657.Google Scholar
[2] Pearton, S. J., et al, Superlattice and Microstructures 34 2003). p. 3–32.Google Scholar
[3] Wang., Z. L., et al, Journal of Physics: Condensed Matter 16 2004). p. R829–R858.Google Scholar
[4] Tu., Z. C., et al, Physical Review B 74 2006). p. 035434.CrossRefGoogle Scholar
[5] Quang., H. T., et al, ACS Nano 9 2015). p. 11408–11413.Google Scholar
[6] Hong, H. K., et al, Nano Letters 17 2017). p. 120–127.Google Scholar
[7] This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (No. 2015R1A2A2A01006992), Nano Material Technology Development Program (2012M3A7B4049807) and IBS-R019-D1.Google Scholar