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Environmental TEM, A CTF Approach for Atmospheric Lattice Imaging

Published online by Cambridge University Press:  08 April 2017

M Suzuki  and
T Yaguchi
M Suzuki
Affiliation:
Hitachi High-Technologies Corporation
T Yaguchi
Affiliation:
Hitachi High-Technologies Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 454 - 455
Copyright
Copyright © Microscopy Society of America 2011