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Environmental Real Time Imaging with 200kV FE Aberration-corrected Analytical Scanning Transmission Electron Microscope (ESTEM) System with an Open Window Gas Injection

Published online by Cambridge University Press:  01 August 2018

H. Inada ,
H. Kikuchi ,
A. Hanawa ,
Y. Suzuki ,
M. Shirai  and
K. Nakamura
H. Inada
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan
H. Kikuchi
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan
A. Hanawa
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan
Y. Suzuki
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan
M. Shirai
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan
K. Nakamura
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 318 - 319
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Inada, H, et al, Microsc. Microanal 23 2017) p. 918.Google Scholar
[2] Inada, H, et al, Microsc. Microanal 22 2016) p. 32.Google Scholar
[3] Inada, H, et al, European Microsc. Congress 1 2016) p. 334.Google Scholar
[4] Matsumoto, H, et al, Microsc. Microanal 27(7 2013) p. 11.Google Scholar
[5] Zhu, Y, et al, Nature Mater 8 2009) p. 808.Google Scholar