Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-27T11:27:33.930Z Has data issue: false hasContentIssue false
  • English
  • Français

Environmental Monitoring During Decommissioning of a CNT Manufacturing Facility Using Polarized Light Microscopy and FE-SEM

Published online by Cambridge University Press:  08 April 2017

E Schumacher ,
S Stoeffler ,
C Schwandt  and
K Diebold
E Schumacher
Affiliation:
McCrone Associates, Inc
S Stoeffler
Affiliation:
McCrone Associates, Inc
C Schwandt
Affiliation:
McCrone Associates, Inc
K Diebold
Affiliation:
McCrone Associates, Inc

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1534 - 1535
Copyright
Copyright © Microscopy Society of America 2011