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Enhanced Four Video-Outputs Backscattered Electron Detector (AsB4) Enabling Live 3D Sample Surface Modeling (3DSM) Even Under Very High Gain Conditions

Published online by Cambridge University Press:  23 November 2012

M. Aliman ,
W. Berger  and
J. Paluszynski
M. Aliman
Affiliation:
NTS-OEE, Carl Zeiss NTS GmbH, Oberkochen, Germany
W. Berger
Affiliation:
NTS-OEE, Carl Zeiss NTS GmbH, Oberkochen, Germany
J. Paluszynski
Affiliation:
NTS-OEE, Carl Zeiss NTS GmbH, Oberkochen, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 566 - 567
Copyright
Copyright © Microscopy Society of America 2012

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