Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T00:26:26.619Z Has data issue: false hasContentIssue false
  • English
  • Français

Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope

Published online by Cambridge University Press:  25 July 2016

Felix Börrnert ,
Johannes Biskupek ,
Zhongbo Lee ,
Martin Linck ,
Peter Hartel ,
Heiko Müller ,
Maximilian Haider  and
Ute A. Kaiser
Felix Börrnert
Affiliation:
Materialwissenschaftliche Elektronenmikroskopie, Universitat Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany
Johannes Biskupek
Affiliation:
Materialwissenschaftliche Elektronenmikroskopie, Universitat Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany
Zhongbo Lee
Affiliation:
Materialwissenschaftliche Elektronenmikroskopie, Universitat Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany
Martin Linck
Affiliation:
CEOS GmbH, EnglerstraBe 28, 69126 Heidelberg, Germany
Peter Hartel
Affiliation:
CEOS GmbH, EnglerstraBe 28, 69126 Heidelberg, Germany
Heiko Müller
Affiliation:
CEOS GmbH, EnglerstraBe 28, 69126 Heidelberg, Germany
Maximilian Haider
Affiliation:
CEOS GmbH, EnglerstraBe 28, 69126 Heidelberg, Germany
Ute A. Kaiser
Affiliation:
Materialwissenschaftliche Elektronenmikroskopie, Universitat Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 880 - 881
Copyright
© Microscopy Society of America 2016 

References

[1] Banhart, F Reports on Progress in Physics 62 (1999). p. 1181.CrossRefGoogle Scholar
[2] Egerton, R F, Li, P & Malac, M Micron 35 (2004). p. 399.CrossRefGoogle Scholar
[3] Meyer, J C, et al, Physical Review Letters 108 (2012). p. 196102.CrossRefGoogle Scholar
[4] Sasaki, T, et al, Journal of Electron Microscopy 59 (2010). p. S7.CrossRefGoogle Scholar
[5] Kaiser, U, et al, Ultramicroscopy 111 (2011). p. 1239.CrossRefGoogle Scholar
[6] Morishita, S, et al, Applied Physics Letters 108 (2016). p. 013107.CrossRefGoogle Scholar
[7] Fruitful cooperation within the SALVE project and financial support by the DFG (German Research Foundation) and by the Ministry of Science, Research, and the Arts (MWK) of Baden–Wurttemberg are gratefully acknowledged.Google Scholar