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Energy dispersive micro-XRF Bragg-pattern visualization – Laue Mapping

Published online by Cambridge University Press:  30 July 2021

Max Buegler ,
Roald Tagle ,
Falk Reinhardt ,
Andrew Menzies  and
Tina Hill
Max Buegler
Affiliation:
Bruker Nano GmbH, Berlin, Berlin, Germany
Roald Tagle
Affiliation:
Bruker Nano GmbH, Berlin, Berlin, Germany
Falk Reinhardt
Affiliation:
Bruker Nano GmbH, Berlin, Berlin, Germany
Andrew Menzies
Affiliation:
Bruker Nano GmbH, Berlin, Berlin, Germany
Tina Hill
Affiliation:
Bruker Nano GmbH, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2208 - 2209
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Guguschev, C., Tagle, R., Juda, U., Kwasniewski, A. ‘Microstructural investigations of SrTiO3 single crystals and polysilicon using a powerful new X-ray diffraction surface mapping technique’; J. Appl. Cryst. (2015). 48, 1883-1888; https://doi.org/10.1107/S1600576715019949Google Scholar