Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-27T07:47:03.365Z Has data issue: false hasContentIssue false
  • English
  • Français

EMCD – Magnetic Chiral Dichroism in the Electron Microscope

Published online by Cambridge University Press:  27 August 2014

P. Schattschneider
P. Schattschneider*
Affiliation:
Service Centre for Electron Microscopy, Vienna University of Technology, Vienna, Austria Institute of Solid State Physics, Vienna University of Technology, Vienna, Austria Ecole Centrale Paris, LMSSMat (CNRS UMR 8579), Chatenây-Malabry, France

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2136 - 2137
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Schattschneider, P., et al., Nature 441 (2006), p. 486.Google Scholar
[2] Löffler, S., Schattschneider, P. Ultramicroscopy 110 (2010), p. 831.Google Scholar
[3] Schattschneider, P., et al, Ultramicroscopy 110 (2010), p. 1038.Google Scholar
[4] Schattschneider, P., et al, Phys. Rev. B 85 (2012), p. 134422.Google Scholar
[5] Uchida, M., Tonomura, A. Nature 464 (2010), 737.Google Scholar
[6] Verbeeck, J., Tian, H., Schattschneider, P. Nature 469 (2010),p. 301.Google Scholar
[7] Linear and Chiral Dichroism in the Electron Microscope, ed. Schattschneider (P. Pan.Google Scholar
Stanford, Singapore) ISBN: 9789814267489.Google Scholar
[8] Schattschneider, P., et al, Phys. Rev. B 78 (2008),104413.Google Scholar
[9] Calmels, L., et al, Phys. Rev. B 76 (2007), 060409.Google Scholar
[10] Rusz, J., et al, Phys. Rev. B 76 (2007),060408.Google Scholar
[11] The author acknowledges funding from the Austrian Science Fund, project no. I543-N20. I thank C. Hébert, S. Löffler, M. Nelhiebel, S. Rubino, M. Stöger-Pollach, J. Verbeeck and many others for their ideas and fruitful discussions.Google Scholar