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Electronic Structure of New Line Defect in Strained NdTiCb on SrTiO3

Published online by Cambridge University Press:  23 September 2015

Jong Seok Jeong ,
Mehmet Topsakal ,
Peng Xu ,
Renata M. Wentzcovitch ,
Bharat Jalan  and
K. Andre Mkhoyan
Jong Seok Jeong
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, U.S.A.
Mehmet Topsakal
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, U.S.A.
Peng Xu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, U.S.A.
Renata M. Wentzcovitch
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, U.S.A.
Bharat Jalan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, U.S.A.
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, U.S.A.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2073 - 2074
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Nakagawa, N, et al, Nature Materials 5 (2006). p 204.CrossRefGoogle Scholar
[4] Xu, P, et al, Applied Physics Letters 104 (2014). p 082109.CrossRefGoogle Scholar
[5] Kresse, G & Hafner, J, Physical Review B 47 (1993). p 558.Google Scholar
[6] This work was supported in part by C-SPIN, one of the six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA. STEM analysis was carried out in the Characterization Facility of the University of Minnesota, which receives partial support from NSF through the MRSEC program.Google Scholar