Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-28T16:36:11.488Z Has data issue: false hasContentIssue false
  • English
  • Français

Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS

Published online by Cambridge University Press:  27 August 2014

D.M. Kepaptsoglou ,
C.R. Seabourne ,
T. Hardcastle ,
R. Nicholls ,
W. Pierce ,
R. Zan ,
U. Bangert ,
A.J. Scott  and
Q.M. Ramasse
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, United Kingdom
C.R. Seabourne
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
T. Hardcastle
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
R. Nicholls
Affiliation:
Department of Materials, University of Oxford, Oxford, United Kingdom
W. Pierce
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom
R. Zan
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom
U. Bangert
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom Department of Physics and Energy, University of Limerick, Limerick, Ireland
A.J. Scott
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, United Kingdom

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1734 - 1735
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Krivanek, O.L., Chisholm, M.F., Murfitt, M., et al., Ultramicroscopy 123 (2012), p. 90.Google Scholar
[2] Suenaga, K., Sato, Y., Liu, Z., et al., Nature Chem 1 (2009), p. 415-418.Google Scholar
[3] Lovejoy, T. C., Ramasse, Q.M., Falke, M., et al., Appl. Phys. Lett. 100 (2012), 154101.Google Scholar
[4] Ramasse, Q. M., Seabourne, C. R., Kepaptsoglou, D.M., et al., Nano Lett. 12 (8) (2012), p. 3936.Google Scholar
[5] Zhou, W., Kapetanakis, M. D., Prange, M.P., et al., Phys. Rev. Lett. 109 (2012), 206803.Google Scholar
[6] Nicholls, R.J., Murdock, A.T., Tsang, J., et al., ACS Nano 7 (2013), p. 7145.Google Scholar
[7] Bangert, U., Pierce, W., Kepaptsoglou, D.M., et al., Nano Letters 13 (2013), p. 4902.Google Scholar
[8] Xu, Y., Zhang, K., Brüsewitz, C., et al., AIP Advances 3 (2013), p. 072120.Google Scholar
[9] SuperSTEM is the UK National Facility for Aberration-Corrected STEM and is funded by the UK Engineering and Physical Sciences Research Council(EPSRC).Google Scholar