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Electronic Properties of Carbon Nanotubes via Aloof Experiments Using Transmission-EELS

Published online by Cambridge University Press:  02 July 2020

Bryan W. Reed  and
Mehme Sarikaya
Bryan W. Reed
Affiliation:
Materials Science & Engineering, University of Washington, Seattle, WA, 98195, USA
Mehme Sarikaya
Affiliation:
Materials Science & Engineering, University of Washington, Seattle, WA, 98195, USA
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Abstract

Carbon nanotubes (CNT) have great potential as one-dimensional quantum conductors in future molecular electronic applications. Local electronic property determinations at low energies in CNT have been confined to those made by scanning probe microscopy techniques (SPM). Although SPM measurements provide unprecedented electronic property information, they suffer from substrate coupling and a limited ability to measure structural characteristics of nanotubes. A high-resolution transmission electron microscope (TEM) coupled with an electron energy loss spectrometer (EELS) offers electronic property determination as well as structural (imaging and diffraction) and spectroscopic analysis of truly isolated nanotubes. Here we report measurements of EEL spectra of single-walled CNT, both singly and in bundles. The experiments were performed in a VG HB501 STEM at Cornell University, operating at 100 kV. CNT samples chosen for analysis include isolated single-walled tubes with diameters 1.2-1.3 nm and bundles of ∼3-150 single-walled tubes. Many of the spectra were obtained in the aloof mode, i. e. with the beam not penetrating the material.

Type
Quantitative STEM: Imaging and EELS Analysis Honoring the Contributions of John Silcox (Organized by P. Batson, C. Chen and D. Muller)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 192 - 193
Copyright
Copyright © Microscopy Society of America 2001

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References

See, e.g., Collins, P. G.et al., Phys. Rev. Lett., 82 (1) 165 (1999).CrossRefGoogle Scholar
Odom, T. W.et al., Nature 391, 62 (1998).CrossRefGoogle Scholar
Reed, B. W. and Sarikaya, M., submitted to Phys. Rev. B (2001).Google Scholar
See, e. g., Kociak, M.et al., Phys. Rev. B 61, 13936 (2000).CrossRefGoogle Scholar
Pichler, T.et al., Phys. Rev. Lett. 80, 4729 (1998).CrossRefGoogle Scholar
We acknowledge Professor John, Silcox and colleagues at Cornell for invaluable discussions and the use of their facilities. This work was supported by an NSF Grant #DMR 9978835.Google Scholar