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Electronic Behaviors of Individual Defects and Boundaries in 2D Materials: A Spatially Resolved Study with Multi-Probe Scanning Tunneling Microscopy

Published online by Cambridge University Press:  25 July 2016

An-Ping Li
An-Ping Li*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 364 - 365
Copyright
© Microscopy Society of America 2016 

References

References:

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