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Electronic and Magnetic Structure of LaSr-2×4 Manganese Oxide Molecular Sieve Nanowires

Published online by Cambridge University Press:  16 April 2014

Jaume Gazquez ,
Adrián Carretero-Genevrier ,
Martí Gich ,
Narcís Mestres  and
María Varela
Jaume Gazquez*
Affiliation:
Institut de Ciència de Materials de Barcelona ICMAB, Consejo Superior de Investigaciones Científicas CSIC, 08193 Bellaterra, Spain
Adrián Carretero-Genevrier
Affiliation:
Laboratoire Chimie de la Matière Condensée, UMR UPMC-Collège de France-CNRS 7574, Collège de France, 11 Place Marcelin Berthelot, 75231 Paris, France Institut des Nanotechnologies de Lyon (INL) CNRS - Ecole Centrale de Lyon., 36 avenue Guy de Collongue, 69134 Ecully
Martí Gich
Affiliation:
Institut de Ciència de Materials de Barcelona ICMAB, Consejo Superior de Investigaciones Científicas CSIC, 08193 Bellaterra, Spain
Narcís Mestres
Affiliation:
Institut de Ciència de Materials de Barcelona ICMAB, Consejo Superior de Investigaciones Científicas CSIC, 08193 Bellaterra, Spain
María Varela
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA Departamento de Física Aplicada III & Instituto Pluridisciplinar, Universidad Complutense de Madrid, Madrid 28040, Spain
*
*Corresponding author.[email protected]
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Abstract

In this study we combine scanning transmission electron microscopy, electron energy loss spectroscopy and electron magnetic circular dichroism to get new insights into the electronic and magnetic structure of LaSr-2×4 manganese oxide molecular sieve nanowires integrated on a silicon substrate. These nanowires exhibit ferromagnetism with strongly enhanced Curie temperature (Tc>500 K), and we show that the new crystallographic structure of these LaSr-2×4 nanowires involves spin orbital coupling and a mixed-valence Mn3+/Mn4+, which is a must for ferromagnetic ordering to appear, in line with the standard double exchange explanation.

Keywords

EELSSTEMnanoparticlesnanowiresmanganese molecular sieveswhite linesoxidation state
Type
EDGE Special Issue
Information
Microscopy and Microanalysis , Volume 20 , Issue 3 , June 2014 , pp. 760 - 766
Copyright
© Microscopy Society of America 2014 

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