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Electron Spectroscopic Imaging and Diffraction: Ideal Tools for the Characterization of Ceramic Materials

Published online by Cambridge University Press:  02 July 2020

J. Mayer ,
J. Plitzko ,
J. Marien ,
S. Krämer  and
T. Gemming
J. Mayer
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, F. R., Germany
J. Plitzko
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, F. R., Germany
J. Marien
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, F. R., Germany
S. Krämer
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, F. R., Germany
T. Gemming
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, F. R., Germany
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Extract

The most widely spread application of energy filtering transmission electron microscopy (EFTEM) is the determination of elemental distributions in analytical investigations. The new EFTEM techniques are based on data acquisition by electron spectroscopic imaging (ESI), which offers the advantage of fast two-dimensional recording of the inner-shell loss intensities. In a more general framework, the new ESI methods and the standard PEELS technique both aim at exploring the same three dimensional data space. This data space is represented by the spatial coordinates x, y and the energy loss ΔE and the resulting intensity distribution I(x,y,ΔE) is the quantity which is evaluated. It is intuitively clear, that acquiring more than just three consecutive ESI images gives us the possibility to get quantitative information about the spectra and the shape of the ionization edge. The information on the EEL spectrum can be extracted from a series of ESI images for each individual pixel or, by integrating over corresponding pixels, for a given image area and can be quantified by applying standard EELS quantification techniques.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 788 - 789
Copyright
Copyright © Microscopy Society of America

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