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Electron Microscopy Investigations of Doped ZnS Nanostructures

Published online by Cambridge University Press:  25 July 2016

C. Virgil Solomon  and
Jung-Il Hong
C. Virgil Solomon
Affiliation:
Department of Mechanical & Industrial Engineering, Youngstown State University, Youngstown, Ohio, USA
Jung-Il Hong
Affiliation:
Daegu Gyeongbuk Institute of Science & Technology, Daegu, Republic of Korea

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1646 - 1647
Copyright
© Microscopy Society of America 2016 

References

[1] Fang, X., et al., Critical Reviews in Solid State and Materials Sciences 34 (2009). p 190.Google Scholar
[2] Moore, D. & Wang, Z. Journal of Materials Chemistry 16 (2006). p. 3898.Google Scholar
[3] Yang, S., et al., Applied Physics Letters 100 (2012) 101907.CrossRefGoogle Scholar
[4] The authors acknowledge the use of Electron Microscopy Facility within the Center for Excellence in Materials Science and Engineering at YSU. The NSF, DMR 1229129 support is acknowledged.Google Scholar