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Electron microscopy characterization of W-O multilayers

Published online by Cambridge University Press:  21 August 2009

N. M. G. Parreira ,
T. Polcar ,
Y. T. Pei ,
D. Galvan ,
J. Th. M. De Hosson  and
A. Cavaleiro
N. M. G. Parreira
Affiliation:
SEG-CEMUC, Mechanical Eng Department, University of Coimbra, Portugal
T. Polcar
Affiliation:
SEG-CEMUC, Mechanical Eng Department, University of Coimbra, Portugal Faculty of Electrical Eng., Czech Technical University Prague, Czech Republic
Y. T. Pei
Affiliation:
Department of Applied Physics, Materials Innovation Institute (M2i), University of Groningen, The Netherlands
D. Galvan
Affiliation:
Department of Applied Physics, Materials Innovation Institute (M2i), University of Groningen, The Netherlands
J. Th. M. De Hosson
Affiliation:
Department of Applied Physics, Materials Innovation Institute (M2i), University of Groningen, The Netherlands
A. Cavaleiro
Affiliation:
SEG-CEMUC, Mechanical Eng Department, University of Coimbra, Portugal

Abstract

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In the decorative field, besides the optical characteristics needed for achieving desired colours, the material should have suitable properties able to assure the daily use of the component without significant degradation. Oxides are well known materials with a high wear and corrosion resistance which make them a preferential choice of coatings for environmental protection. However, the intrinsic colours possible to be achieved in a single oxide system are very limited. For example in W-O system, besides the different tonalities of grey, only the dark blue can be obtained for slightly substochiometric WO3 compound. The pallet of colours exhibited by WO3 coatings is due to interferometric effects. Recently, it was shown that playing with the gradient of the chemical composition of W-O layers it was possible to tune the global colour of the coatings, which made this system an attractive candidate for decorative applications.

Type
Materials Sciences
Information
Microscopy and Microanalysis , Volume 15 , Supplement S3 , July 2009 , pp. 59 - 60
Copyright
Copyright © Microscopy Society of America 2009