Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-03T05:01:35.925Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Microscopy Characterization of Carbon Nanotube Based Electrical and Mechanical Test Structures

Published online by Cambridge University Press:  31 July 2006

D McClain ,
J Jiao ,
C McCarter ,
D Bahr ,
C Richards  and
R Richards
D McClain
Affiliation:
Portland State University
J Jiao
Affiliation:
Portland State University
C McCarter
Affiliation:
Washington State University
D Bahr
Affiliation:
Washington State University
C Richards
Affiliation:
Washington State University
R Richards
Affiliation:
Washington State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 680 - 681
Copyright
© 2006 Microscopy Society of America