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Electron Microscopy Analysis of the Intermediate Phases Formed During the Nucleation of Yba2cu3O7-δ Film

Published online by Cambridge University Press:  02 July 2020

Lijun Wu ,
Yimei Zhu ,
V. F. Solovyov ,
H. J. Wiesmann  and
M. Suenaga
Lijun Wu
Affiliation:
Energy Sciences and Technology Dept, Brookhaven National Laboratory, Upton, New York, 11973
Yimei Zhu
Affiliation:
Energy Sciences and Technology Dept, Brookhaven National Laboratory, Upton, New York, 11973
V. F. Solovyov
Affiliation:
Energy Sciences and Technology Dept, Brookhaven National Laboratory, Upton, New York, 11973
H. J. Wiesmann
Affiliation:
Energy Sciences and Technology Dept, Brookhaven National Laboratory, Upton, New York, 11973
M. Suenaga
Affiliation:
Energy Sciences and Technology Dept, Brookhaven National Laboratory, Upton, New York, 11973
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Abstract

Recently, considerable efforts have been made in growing bi-axially aligned thick Yba2cu3O7 (YBCO) films on a flexible, textured metallic substrate for electrical power applications. The BaF2 post-deposition annealing process is one of the most promising methods. to understand the nucleation and growth mechanism of YBCO in this process, extended transmission electron microscopy analysis has been made. Here, we report on the evolution of Ba-Y oxy-fluoride which is pertinent to the epitaxial YBCO nucleation process on SrTiO3 (STO) substrate.

The stoichiometric ratio of Y, Cu and BaF2 was evaporated on (00l)-cut STO substrate Subsequently, these films were annealed at 735°C in an O2-H2O-N2 gas atmosphere and quenched after 10, 20, or 40 minutes. The morphology and phase composition of the precursor changed drastically with the annealing times, e.g. after 10 minutes heat treatment, the precursor consisted of fine grained CU2O and Ba-Y(Cu) oxy-fluoride (cubic, a=0.618nm) as shown in fig.la.

Type
Novel Microscopy Assisted Ceramic Developments in Materials Scienceand Nanotechnology (Organized by P. Gai and J. Lee)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 424 - 425
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Lijun, Wu, Zhu, Y., Solovyov, V. F., Wiesmann, H. J., Moodenbaugh, A. R., Sabatini, R. L., and Suenaga, M., Submitted to J. Mater. Res.Google Scholar
2. Work supported by US Department of Energy under contract No. DE-AC02-98CH10886.Google Scholar