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Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires

Published online by Cambridge University Press:  08 September 2011

Martin Ek ,
Magnus T. Borgström ,
Lisa S. Karlsson ,
Crispin J.D. Hetherington  and
L. Reine Wallenberg
Martin Ek*
Affiliation:
nCHREM/Polymer & Materials Chemistry, Lund University, Box 124, S-221 00 Lund, Sweden
Magnus T. Borgström
Affiliation:
Solid State Physics, Lund University, Box 118, S-221 00, Lund, Sweden
Lisa S. Karlsson
Affiliation:
Department of Materials, University of Oxford, Parks Rd., Oxford OX1 3PH, UK
Crispin J.D. Hetherington
Affiliation:
Department of Materials, University of Oxford, Parks Rd., Oxford OX1 3PH, UK
L. Reine Wallenberg
Affiliation:
nCHREM/Polymer & Materials Chemistry, Lund University, Box 124, S-221 00 Lund, Sweden
*
Corresponding author. E-mail: [email protected]
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Abstract

The twin interface structure in twinning superlattice InP nanowires with zincblende structure has been investigated using electron exit wavefunction restoration from focal series images recorded on an aberration-corrected transmission electron microscope. By comparing the exit wavefunction phase with simulations from model structures, it was possible to determine the twin structure to be the ortho type with preserved In-P bonding order across the interface. The bending of the thin nanowires away from the intended ⟨110⟩ axis could be estimated locally from the calculated diffraction pattern, and this parameter was successfully taken into account in the simulations.

Keywords

transmission electron microscopyexit-wave reconstructionaberration correctionnanowirestwinningindium phosphide
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 5 , October 2011 , pp. 752 - 758
Copyright
Copyright © Microscopy Society of America 2011

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References

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