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Electron Holography and Digital Imaging for Analysis of Nanostructured Materials

Published online by Cambridge University Press:  02 July 2020

L. F. Allard ,
E. Voelkl ,
A. K. Datye  and
A. H. Carim
L. F. Allard
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN
E. Voelkl
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN
A. K. Datye
Affiliation:
Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, NM
A. H. Carim
Affiliation:
Department of Materials Science and Engineering, Penn State University, State College, PA
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Extract

Many nanostructured materials are formed from powder precursors having ultra-fine particle sizes. Techniques of electron microscopy have proven invaluable for characterizing the structure of the precursor materials in order to better understand the fundamental processes that govern consolidation of the materials into the final nanophase structures. In recent years, the rapidly developing technique of electron holography has increasingly been applied for characterizing particle morphologies. The advent of the modern field emission microscope, which offers beam coherency sufficient to produce high contrast interference fringes for optimum hologram formation, and especially the availability of digital camera systems for hologram acquisition and rapid processing have both combined to bring electron holography to the forefront of techniques for characterization of nanostructured materials.

Electron holograms typically yield phase images that can give quantitative information on crystal morphologies, but much additional information can result from digital processing of holograms.

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 750 - 751
Copyright
Copyright © Microscopy Society of America

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References

1.Voelkl, E., et al., Proc. Micros. & Microanal. 1995, Bailey, G.W. et al., eds., Jones & Begell, 616.Google Scholar
2. Research sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed for the Department of Energy by Lockheed Martin Energy Research Corp., under contract DE-AC05-96OR22464.Google Scholar