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Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials

Published online by Cambridge University Press:  25 July 2016

Frédéric Voisard ,
Hendrix Demers ,
Michel Trudeau ,
George P. Demopoulos ,
Raynald Gauvin  and
Karim Zaghib
Frédéric Voisard
Affiliation:
McGill University, Department of Mining and Materials Engineering, Montréal, Canada
Hendrix Demers
Affiliation:
McGill University, Department of Mining and Materials Engineering, Montréal, Canada
Michel Trudeau
Affiliation:
Institut de Recherche Hydro Québec, IREQ, Varennes, Canada
George P. Demopoulos
Affiliation:
McGill University, Department of Mining and Materials Engineering, Montréal, Canada
Karim Zaghib
Affiliation:
Institut de Recherche Hydro Québec, IREQ, Varennes, Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1294 - 1295
Copyright
© Microscopy Society of America 2016 

References

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