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Electron Diffraction Spectral Imaging and Multivariate Statistical Analysis for Structural Mapping of Amorphous and Nano-crystalline Composites

Published online by Cambridge University Press:  01 August 2010

P Lu ,
LN Brewer ,
PG Kotula ,
M Rodriguez ,
E Webb  and
J Hsu
P Lu
Affiliation:
Sandia National Laboratories
LN Brewer
Affiliation:
Sandia National Laboratories
PG Kotula
Affiliation:
Sandia National Laboratories
M Rodriguez
Affiliation:
Sandia National Laboratories
E Webb
Affiliation:
Sandia National Laboratories
J Hsu
Affiliation:
Sandia National Laboratories

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 272 - 273
Copyright
Copyright © Microscopy Society of America 2010