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Electron Diffraction from a Single Atom and Optimal Signal Detection

Published online by Cambridge University Press:  25 July 2016

David A. Muller ,
Yimo Han ,
Kayla X. Nguyen ,
Mark W. Tate ,
Prafull Purohit ,
Saien Xie ,
Jiwoong Park  and
Sol M. Gruner
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute for Nanoscale Science, Cornell University
Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Kayla X. Nguyen
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY, USA
Mark W. Tate
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Prafull Purohit
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Saien Xie
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Jiwoong Park
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY, USA
Sol M. Gruner
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 846 - 847
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Voyles, P.M., et al, Nature 416 (2002) 826.Google Scholar
[2] Kaiser, U., et al, Nature Materials 1 (2002) 102–105.Google Scholar
[3] Treacy, M. M. J. & Rice., S. B. Journal of Microscopy-Oxford 156 (1989) 211–234.Google Scholar
[4] Hovden, R. & Muller., D. A. Ultramicroscopy 123 (2012) 59–65.Google Scholar
[5] Tate, M. W., et al, Microsc. Microanal. 22, 237–249, 2016.Google Scholar
[6] EM development supported by the NSF MRSEC program (DMR 1120296). Detector development supported by DOE DE-FG02-10ER46693 and the Kavli Institute at Cornell.Google Scholar