Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-12-04T09:56:34.733Z Has data issue: false hasContentIssue false

Electron Beam Induced Processing: Experimentation, Simulation, and Applications

Published online by Cambridge University Press:  03 August 2008

JD Fowlkes
Affiliation:
Oak Ridge National Laboratory
DA Smith
Affiliation:
The University of Tennessee, Knoxville
PD Rack
Affiliation:
Oak Ridge National Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)