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Electrical and mechanical probing of nanostructures with transmission electron microscopy

Published online by Cambridge University Press:  21 August 2009

P. M. F. J. Costa ,
Y. Bando  and
D. Golberg
P. M. F. J. Costa
Affiliation:
CICECO, Department of Chemistry, University of Aveiro, 3810-193 Aveiro, Portugal
Y. Bando
Affiliation:
MANA, National Institute for Materials Science, 305-0044 Ibaraki, Japan
D. Golberg
Affiliation:
MANA, National Institute for Materials Science, 305-0044 Ibaraki, Japan

Abstract

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Recent developments in the design of holders for transmission electron microscopes (TEM) have enabled widespread property analysis of nanostructures with unprecedented spatial resolution. It is now possible to routinely and reliably test the mechanical and electrical characteristics of a single carbon nanotube (CNT), for instance. Furthermore, due to the multitasking capability of TEMs, the study can even integrate simultaneous imaging and spectroscopical analysis. The combination of real-time gathering of structural, chemical, electrical and mechanical information provides an outstanding view of the materials' reactions when subjected to external stimulus such as current or heat.

Type
Materials Sciences
Information
Microscopy and Microanalysis , Volume 15 , Supplement S3 , July 2009 , pp. 47 - 48
Copyright
Copyright © Microscopy Society of America 2009