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Elastic and Plastic Strain Measurement Using Electron Backscatter Diffraction Technique: The Influence of Sample Preparation

Published online by Cambridge University Press:  05 August 2019

Pawel Nowakowski ,
Jorg Wiezorek ,
Ian Spinelli ,
Mary Ray  and
Paul Fischione
Pawel Nowakowski*
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA.
Jorg Wiezorek
Affiliation:
University of Pittsburgh, Pittsburgh, PA, USA.
Ian Spinelli
Affiliation:
GE Global Research Center, Niskayuna, NY, USA.
Mary Ray
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA.
Paul Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 534 - 535
Copyright
Copyright © Microscopy Society of America 2019 

References

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