Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-28T13:42:25.445Z Has data issue: false hasContentIssue false
  • English
  • Français

EFTEM Mapping of Copper - Porous SiLK Structures

Published online by Cambridge University Press:  01 August 2002

Alline Myers  and
Suzette Pangrle
Alline Myers
Affiliation:
Advanced Micro Devices, One AMD Place, P.O. Box 3453, MS 32, Sunnyvale, CA 94088
Suzette Pangrle
Affiliation:
Advanced Micro Devices, One AMD Place, P.O. Box 3453, MS 32, Sunnyvale, CA 94088

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1194 - 1195
Copyright
Copyright © Microscopy Society of America 2002