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Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial

Published online by Cambridge University Press:  05 August 2019

Timothy J. Pennycook ,
Gerardo T. Martinez ,
Colum M. O'Leary ,
Hao Yang  and
Peter D. Nellist
Timothy J. Pennycook*
Affiliation:
Electron microscopy for materials science, University of Antwerp, Antwerp, Belgium. Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, StuttgartGermany.
Gerardo T. Martinez
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Colum M. O'Leary
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Hao Yang
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, USA
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
*
*Corresponding author: [email protected]

Abstract

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Type
Efficient Phase Contrast Imaging via Electron Ptychography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2684 - 2685
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Pennycook, T. J. et al. , Ultramicrosopy 151 (2015), p. 160.Google Scholar
[2]Yang, H. et al. , Nat. Commun. 7 (2016), p. 12532.Google Scholar
[3]Yang, H., Pennycook., T. J., and Nellist, P. D., Ultramicrosopy 151 (2015), p. 252.Google Scholar
[4]Pennycook, T. J. et al. , Ultramicroscopy 196 (2019), p. 131.Google Scholar
[5]TJP acknowledges support from the EU Marie Skłodowska-Curie grant No. 655760 – DIGIPHASE, and the European Research Council Grant no. 802123 HDEM.Google Scholar