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The Effects of P and Pt on the Microstructure of Co-Cr-P-Pt Thin Film Magnetic Recording Media

Published online by Cambridge University Press:  02 July 2020

Ju-Hwan Choi ,
Changmo Sung ,
Lawrence F. Allard  and
Kyung HoShin
Ju-Hwan Choi
Affiliation:
Center for Advanced Materials, University of Massachusetts, Lowell, MA01854
Changmo Sung
Affiliation:
Center for Advanced Materials, University of Massachusetts, Lowell, MA01854
Lawrence F. Allard
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN37831
Kyung HoShin
Affiliation:
Department of Advanced Materials Engineering, Korea Advanced Institute of Science & Technology, Seoul130-012, KOREA
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Because of their high coercivity, cobalt alloy thin films are among the most popular materials used for ultra-high density longitudinal magnetic recording media. The recording and magnetic properties of the materials are related to their microstructure; in particular, depletion of Co in a grain boundary phase, and physical separation of the grains act to increase coercivity and thus to produce low noise media. We are studying a new alloy system comprising 18 nm thick Co-Cr-P-Pt films (Mr.t ≈ 0.9 memu/cm2), prepared by DC sputtering. A coercivity of 2600 Oe or higher was obtained in these films even when they were deposited without heating the substrate or applying a bias voltage. The effects of P and Pt addition were characterized by high-resolution TEM coupled with energy dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS). A Hitachi HF-2000 field emission TEM was used to image both low P (≈ 6 at. %) and high P (≈ 12 at. %) samples, and to provide a 1 nm beam for high spatial resolution EDS and EELS.

Type
Segregation and Diffusion Analysis in Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 531 - 532
Copyright
Copyright © Microscopy Society of America 1997

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