Effects of Higher-Order Laue Zone Reflections on Atomic Resolution TEM Images of Single Layer and Bilayer Graphene

HS Kim

doi:10.1017/S1431927610053821

Effects of Higher-Order Laue Zone Reflections on Atomic Resolution TEM Images of Single Layer and Bilayer Graphene

Published online by Cambridge University Press: 01 August 2010

HS Kim

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HS Kim: Affiliation:
Kyungsung University, Korea

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 274 - 275

DOI: https://doi.org/10.1017/S1431927610053821 [Opens in a new window]

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Effects of Higher-Order Laue Zone Reflections on Atomic Resolution TEM Images of Single Layer and Bilayer Graphene

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