Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-29T01:09:17.678Z Has data issue: false hasContentIssue false
  • English
  • Français

The Effects of Evactron® Plasma Cleaning on Moxtek® X-ray Windows

Published online by Cambridge University Press:  01 August 2018

Ewa Kosmowska ,
Josh Wong ,
Michael Almond ,
Barbara Armbruster  and
Ronald Vane
Ewa Kosmowska
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA
Josh Wong
Affiliation:
Moxtek Inc., Orem, UT, USA
Michael Almond
Affiliation:
Moxtek Inc., Orem, UT, USA
Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 682 - 683
Copyright
© Microscopy Society of America 2018 

References

[1] Kosmowska, E., et al, Microsc. Microanal. 23(Suppl. 1 2017) p. 74.Google Scholar
[2] Vane, R. Moore, C.A. Microsc. Microanal 20(Suppl. 3 2014) p. 2014.Google Scholar
[3] Vane, R., et al, Microsc. Microanal 10(Suppl. 2 2004) p. 966.Google Scholar