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Effects of Beam-Induced Carbon Deposition on Electron Energy-Loss Spectroscopy Analysis of Compositional Fluctuations in InGaN/GaN Quantum Well LEDs

Published online by Cambridge University Press:  05 August 2019

Sarah A. Goodman ,
Govindo J. Syaranamual ,
Jing Yang Chung ,
Zhang Li ,
Akshay Singh ,
Dong Su ,
Kim Kisslinger ,
Rob Armitage ,
Isaac Wildeson  and
Parijat Deb
...Show all authors
Sarah A. Goodman
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Govindo J. Syaranamual
Affiliation:
Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore.
Jing Yang Chung
Affiliation:
Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore. Department of Materials Science and Engineering, National University of Singapore, Singapore.
Zhang Li
Affiliation:
Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore.
Akshay Singh
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Dong Su
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA.
Kim Kisslinger
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA.
Rob Armitage
Affiliation:
Lumileds LLC, San Jose, CA, USA.
Isaac Wildeson
Affiliation:
Lumileds LLC, San Jose, CA, USA.
Parijat Deb
Affiliation:
Lumileds LLC, San Jose, CA, USA.
Eric Stach
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA.
Silvija Gradecak*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 652 - 653
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Titkov, IE et al. , AIP Adv. 2 (2012), p. 032117.Google Scholar
[3]Specht, P, and Kisielowski, C, Mater. Sci. Semicond. Process. 65 (2017), p. 24.Google Scholar
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[6]The authors acknowledge funding from the Department of Energy, Office of Energy Efficiency and Renewable Energy (EERE) under Award Number DE-EE0007136.Google Scholar