Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-27T12:39:19.188Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of Sampling on Geometric Phase Analysis Sensitivity for Strain Measurement in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

A. Pofelski  and
G. A. Botton
A. Pofelski*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
G. A. Botton*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada Canadian Light Source, 44 Innovation Boulevard, Saskatoon, SK, Canada
*
Corresponding authors: [email protected], [email protected]
Corresponding authors: [email protected], [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Science of Metrology with Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 788 - 790
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Hÿtch, M.J., Snoeck, E., Kilaas, R., Ultramicroscopy 74 (1998) 131–146. doi:10.1016/S0304-3991(98)00035-7.CrossRefGoogle Scholar
Hÿtch, M.J., et al. , Ultramicroscopy 111 (2011) 1328–1337. doi:10.1016/j.ultramic.2011.04.008.CrossRefGoogle Scholar
Jones, L., et al. , Ultramicroscopy 179 (2017) 57–62. doi:10.1016/j.ultramic.2017.04.007CrossRefGoogle Scholar
Pofelski, A., et al. , Ultramicroscopy 187 (2018) 1–12. doi:10.1016/j.ultramic.2017.12.016.CrossRefGoogle Scholar
Pofelski, A., STEM Moiré GPA, (2018). doi:10.5281/zenodo.2523087.CrossRefGoogle Scholar
Zhu, Y., et al. , Acta Materialia 61 (2013) 5646–5663. doi:10.1016/j.actamat.2013.06.006.CrossRefGoogle Scholar
Cooper, D., Bernier, N., Rouvière, J.L., Nano Letters 15 (2015) 5289–5294. doi:10.1021/acs.nanolett.5b01614.CrossRefGoogle Scholar
Rouvière, J.L., Sarigiannidou, E., Ultramicroscopy 106 (2005) 1–17. doi:10.1016/j.ultramic.2005.06.001.CrossRefGoogle Scholar
The authors are grateful to the Natural Sciences and Engineering Research Council for a Discovery Grant supporting this workGoogle Scholar