Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-03T05:25:49.942Z Has data issue: false hasContentIssue false

Effect of Oxygen on Sputtered Tantalum Nitride Thin Films for Photoelectrochemical Water Splitting

Published online by Cambridge University Press:  01 August 2018

Sam Macartney
Affiliation:
School of Computing, Engineering and Mathematics, Western Sydney University, Penrith, Australia
Richard Wuhrer
Affiliation:
Advanced Materials Characterisation Facility, Office of the Deputy Vice-Chancellor & Vice-President (Research & Development), Western Sydney University, Penrith, Australia
Leigh R. Sheppard
Affiliation:
School of Computing, Engineering and Mathematics, Western Sydney University, Penrith, Australia

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Katsushi, F., Takeshi, K. Kazuhiro, O. Japanese Journal of Applied Physics 44(4L 2005) p. L543.Google Scholar
[2] Fujishima, A. Honda, K. Nature 238(5385 1972) p. 37.Google Scholar
[3] Maeda, K. Domen, K. The Journal of Physical Chemistry Letters 1(18 2010) p. 2655.Google Scholar
[4] Hitoki, G., et al, Chemistry Letters 31(7 2002) p. 736.Google Scholar
[5] Rudolph, M., et al The role of oxygen in magnetron-sputtered Ta3N5 thin films for the photoelectrolysis of water. Surface and Coatings Technology.Google Scholar