Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-27T12:31:44.801Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM

Published online by Cambridge University Press:  22 July 2022

Oscar Recalde ,
Tianshu Jiang ,
Robert Eilhardt ,
Alexander Zintler ,
Yating Ruan ,
Alexey Arzumanov ,
Tijn van Omme ,
Gin Pivak ,
Hector H. Perez-Garza  and
Philipp Komissinskiy
...Show all authors
Oscar Recalde
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Tianshu Jiang
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Robert Eilhardt
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Alexander Zintler
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Yating Ruan
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Alexey Arzumanov
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Tijn van Omme
Affiliation:
DENSsolutions, Delft, Netherlands
Gin Pivak
Affiliation:
DENSsolutions, Delft, Netherlands
Hector H. Perez-Garza
Affiliation:
DENSsolutions, Delft, Netherlands
Philipp Komissinskiy
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Lambert Alff
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Leopoldo Molina-Luna*
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
From Operando Microcell Experiments to Bulk Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 820 - 821
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Molina-Luna, L et al. , Nature Communications 9(1) (2018), p. 4445. doi: 10.1038/s41467-018-06959-8CrossRefGoogle Scholar
Zhang, Q et al. , Nature Communications 8(1) (2017), p. 104. doi: 10.1038/s41467-017-00121-6CrossRefGoogle Scholar
Nukala, P et al. , Science 372(6542) (2021), p. 630. doi: 10.1126/science.abf3789CrossRefGoogle Scholar
Sato, Y et al. , Applied Physics Letters 111(6) (2017), p. 062904. doi: 10.1063/1.4986361CrossRefGoogle Scholar