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The Effect of High Temperature Annealing on the Grain Characteristics of a Thin Chemical Vapor Deposition Silicon Carbide Layer

Published online by Cambridge University Press:  09 October 2013

I.J. van Rooyen ,
P.M. van Rooyen  and
M.L. Dunzik-Gougar
I.J. van Rooyen
Affiliation:
P.M. van Rooyen
Affiliation:
M.L. Dunzik-Gougar
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1948 - 1949
Copyright
Copyright © Microscopy Society of America 2013