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Effect of an Electric Field within Microscope Monohaz FIB between a Micro Manipulator Sharp and the Ion Trap of the Electron Detector

Published online by Cambridge University Press:  08 April 2017

J Gómez ,
A Hernandez  and
A Duarte
J Gómez
Affiliation:
Centro de Investigacion en Materiales Avanzados, Mexico
A Hernandez
Affiliation:
Centro de Investigacion en Materiales Avanzados, Mexico
A Duarte
Affiliation:
Centro de Investigacion en Materiales Avanzados, Mexico

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 704 - 705
Copyright
Copyright © Microscopy Society of America 2011